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Smiths Interconnect High-Power Burn-In Socket Enables 2,000 W Testing

Source:Industrial Automation / Time:2026-08-07

Smiths Interconnect's high-power burn-in socket (featured at DesignCon 2026) represents a significant advancement in thermal management for semiconductor testing.

Key Specifications:

Parameter

Specification

Contact Count

Up to 22,000 contacts

Device Size

Up to 150 mm × 150 mm

Power Handling

Up to 2,000 W (with integrated liquid cooling)

Applied Load

500 lb (max closing force: 15 lb)

Platform Compatibility

Universally compatible with all advanced burn-in chamber platforms

Thermal Options

Passive heatsinks, heat pipes, liquid cooling

Primary Function:
A specialized electromechanical interface designed to temporarily connect a semiconductor device (CPU, GPU, AI accelerator, or high-power discrete component) to a test board during burn-in and stress testing.

Durability Focus:
Built for extreme durability and thermal/electrical stability under extreme stress conditions, ensuring zero-defect policies for applications in AI data centers and automotive electronics

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